A Study of Sidewall Effects in HgCdTe Photoconductors Passivated with MBE-Grown CdTe
| Autor: | Weida Hu, Lorenzo Faraone, J. Zhang, John Dell, Jarek Antoszewski, Gordon Tsen |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Passivation
business.industry Chemistry Photodetector Semiconductor device Condensed Matter Physics Epitaxy Cadmium telluride photovoltaics Electronic Optical and Magnetic Materials Responsivity Optics Materials Chemistry Optoelectronics Surface layer Electrical and Electronic Engineering business Molecular beam epitaxy |
| Zdroj: | Journal of Electronic Materials. 39:1019-1022 |
| ISSN: | 1543-186X 0361-5235 |
| DOI: | 10.1007/s11664-010-1083-x |
| Popis: | In order to evaluate the effectiveness of CdTe surface passivating layers, HgCdTe photoconductors with and without CdTe sidewall passivation were fabricated. As expected, photoconductors with CdTe sidewall passivation demonstrated significantly higher responsivity in comparison with those without sidewall passivation, indicating the effectiveness of molecular-beam epitaxially (MBE)-grown CdTe as a passivation layer in reducing surface recombination velocity. Characterization of the responsivity differences between photoconductors with and without sidewall CdTe passivation offers a potential method for measuring the interface/surface recombination velocity. This has been demonstrated in this paper by extracting the value of the surface recombination velocity using the Synopsys Sentaurus commercial modeling package to fit experimental responsivity data for fully and partially passivated devices. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink