4He Third Sound and AFM Characterization of Rough Calcium Fluoride Substrates
| Autor: | D. R. Luhman, Robert B. Hallock |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Reproducibility
Materials science business.industry Borosilicate glass chemistry.chemical_element Surface finish Condensed Matter Physics Atomic and Molecular Physics and Optics Characterization (materials science) Optics chemistry Speed of sound Fluorine Surface roughness Deposition (phase transition) General Materials Science Composite material business |
| Zdroj: | Journal of Low Temperature Physics. 134:245-250 |
| ISSN: | 0022-2291 |
| DOI: | 10.1023/b:jolt.0000012562.74005.67 |
| Popis: | We present resugts from experiments utilizing third sound and atomic force microscopy (AFM) that are designed to test the reproducibility of the surface roughness obtained by CaF2 thermal deposition onto borosilicate glass substrates. Third sound speed vs. 4He film thickness data show reasonable agreement for all samples. Statistical analysis of the AFM measurements confirm that surfaces with similar roughness characteristics (∼10 nm) can be fabricated using a common deposition protocol. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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