Special session on machine learning: How will machine learning transform test?

Autor:	Marc Reuben Hutner, Haralampos-G. Stratigopoulos, Yiorgos Makris, Amit Nahar
Rok vydání:	2018
Předmět:	Focus (computing) business.industry Computer science Deep learning Big data Machine learning computer.software_genre Test (assessment) Key (cryptography) Computerized adaptive testing Artificial intelligence Session (computer science) business computer Test data
Zdroj:	VTS
DOI:	10.1109/vts.2018.8368667
Popis:	This special session will discuss how machine learning can transform test. The first talk will review the key challenges and will argue whether contemporary tools, such as deep learning, could offer any advantages over traditional methods. The second talk will focus on extracting useful information from big test data. The third talk will view adaptive test as running machine learning algorithms in real time on big data.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cccc9cdebd38047dcb71b4bc29810b30 https://doi.org/10.1109/vts.2018.8368667 Zobrazit plný text záznamu