Reliability test for subsea power semiconductors
| Autor: | Barbara Scherrer, Jean-Marc Oppliger, David Guillon, Franc Dugal, Heinz Lendenmann |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Materials science
Liquid dielectric Mechanical engineering Semiconductor device Dielectric Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Reliability (semiconductor) Power module Thermal Power semiconductor device Electrical and Electronic Engineering Safety Risk Reliability and Quality Subsea |
| Zdroj: | Microelectronics Reliability. 114:113771 |
| ISSN: | 0026-2714 |
| Popis: | Following the demand from a new domain of application, a test setup was developed to evaluate the performance of high-power semiconductor device when exposed to a dielectric liquid and high pressure. The specific test conditions were established to emulate the conditions inside a tank place in a deep-sea environment. Those conditions can be characterized by two key parameters: the pressure and the chosen dielectric/thermal liquid. The power semiconductor device is to be tested at high and low temperature to simulate operation under maximum load as well as when turned off, respectively. The reliability tests outlined here serve to support the development and the validation of Subsea technology for semiconductors power modules. |
| Databáze: | OpenAIRE |
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