| Autor: |
Donghyeong Kim, Ho Seok Ee, Min-Kyo Seo, Kwang-Yong Jeong, Hong Gyu Park |
| Rok vydání: |
2015 |
| Předmět: |
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| Zdroj: |
2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR). |
| DOI: |
10.1109/cleopr.2015.7375854 |
| Popis: |
We made a novel method for measuring far-field scattering distribution of single nanostructure with high signal-to-background ratio using total-internal-reflection illumination. We achieved wide measurement range by direct scanning over limit of numerical-aperture in conventional back-focal-imaging. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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