Design and performance of a focused beam line for surface x‐ray diffraction

Autor:	M. S. Finney, R. G. van Silfhout, Perry Moore, Gus A. Baker, C. Norris, G. F. Clark
Rok vydání:	1992
Předmět:	Physics Diffraction business.industry Wiggler Vertical plane Particle accelerator law.invention Ray tracing (physics) Optics Beamline law X-ray crystallography Measuring instrument business Instrumentation
Zdroj:	Review of Scientific Instruments. 63:1083-1086
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1143207
Popis:	Focusing optics have been installed on the 5.0 T Wiggler beam line of the SRS at Daresbury Laboratory for use with x‐ray diffraction measurements of surfaces and interfaces. A significant increase in the flux has been achieved without excessive degradation of the resolution in the vertical plane. The full width at half‐maximum of the focused image compares well with the predictions of ray tracing analysis.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cc5b90b159736c11ec1340e8af5e1630 https://doi.org/10.1063/1.1143207 Zobrazit plný text záznamu