Autor: |
J. Y. Zhang, S. B. Liu, H. Wu, P. Chen, Y. J. Zhang, N. Angkawisittpan, S. Sonasang, O. M. Dardeer, A. N. Basmaci, T. A. Khan, E. A. Hajlaoui, E. Jin, Huirun Chen, D. N. Aloi, X. Q. Li, M. H. B. Ucar, Bo Li, S. Ji, J.-S. Park, D. Li, Hong Zhang, Z. Li, J. Luo, S. Ding, Y. Feng, J. Park, W. Tang, J. Zhao, Y. Hu, Z. Song, B. K. Hornbuckle, A. Tariq, D. M. Elsheakh, Wei Wang, K. F. A. Hussein, L. Yuan, Q. Yu, B. Du, S. Pan, Z. Yan, Y. Zhu, S. Guan, S.-Y. Kim, G. Li, K. Mao, X. Kong, X. L. Wang, W. Zhou, M. I. Khattak, J. Yuan, Y. Ji, P. Gurrala, X. Yang, Q. Ren, X. Yu, X. F. Deng, A. Wang, W.-S. Lee, J. Tian, P. D. Sathya, X. Fan, Z. Huang, D. Wang, S. K. A. Rahim, N. RajeshKumar, Yanchu Wang, A. E. Farahat, Z. Yu, J. Liu, A. A. Eteng, Q. Feng, A. M. Yacoub, F. Fan, Z. M. Almohaimeed, M. O. Khalifa, J. Song, J. Yang, Z. Luo, H. Dai, R. Ma, Y. Wen, Q. Wu |
Rok vydání: |
2021 |
Předmět: |
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Zdroj: |
Applied Computational Electromagnetics Society. 36:610-621 |
ISSN: |
1054-4887 |
Popis: |
In this paper, a new robust computational method that applies the geometrical theory of diffraction (GTD) in conjunction with the ray tracing (RT) technique is developed to evaluate the electromagnetic scattering pattern due to a plane wave represented as beam of parallel rays incident on a rough surface of quite arbitrary statistical parameters. The development of the proposed technique is explained in detail taking into consideration the generation of the geometrical model of the rough surface. The Fresnel reflection model is applied under the assumption of arbitrary electrical and optical properties of the rough surface material. Also the polarization of the plane wave primarily incident on the rough surface is taken into consideration. The algorithm developed in the present work accounts for multiple bounces of an incident ray and, hence, it can be considered arbitrary higher-order GTD-RT technique. The accuracy of the obtained results is verified through the comparison with the experimental measurements of the scattering pattern of a light beam incident on rough sheets with specific statistical properties. The numerical results of the present work are concerned with investigating the dependence of the scattering pattern on the surface roughness, refractive index, angle of incidence, and the resolution of the geometric model of the rough surface. Also, it is shown that, for limited resolution of the rough surface model, the accuracy of the calculated scattered field depends on the angle of incidence of the primary beam and the surface roughness. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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