Secondary ions produced from gaseous and frozen H2O under energetic (MeV/amu) Ar ion impact

Autor:	Hiroyuki Tawara, T. Tonuma, T. Matsuo, H. Kumagai, H. Shibata
Rok vydání:	1994
Předmět:	Physics::Plasma Physics Chemistry Cluster (physics) Cluster size Analytical chemistry General Physics and Astronomy Physical and Theoretical Chemistry Mass spectrometry Astrophysics::Galaxy Astrophysics Spectral line Ion
Zdroj:	The Journal of Chemical Physics. 101:5356-5362
ISSN:	1089-7690 0021-9606
DOI:	10.1063/1.467388
Popis:	Mass/charge spectra of secondary ions produced under energetic (∼MeV/amu) Ar ion impact on gaseous and frozen H2O targets are measured using a magnet‐type mass spectrometer. The ion spectra are found to be quite different between these target phases. Multiply charged Oi+ ions with charge states i=2–6, as well as fragmented H+, O+, and OH+ ions, are clearly observed in the gas target, whereas the production of multiply charged ions is strongly suppressed in the frozen target. The most intense ion species is the parent H2O+ ion in the gas target; the H3O+ ion in the frozen target. The most outstanding feature in the frozen target is that the production of cluster ions of the type (H2O)nH+ (n=1–31), and their intensities, decreasing as the cluster size n increases, show anomalies between n=4 and n=5 and also around n=20, 21, and 22. Negatively charged cluster ions with formula (H2O)nO− and (H2O)nOH− are also efficiently produced in the frozen target.
Databáze:	OpenAIRE
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