| Autor: |
Hyuk Chun Noh, Nguyen Van Thuan, Ta Duy Hien |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
Applied Mechanics and Materials. 889:484-488 |
| ISSN: |
1662-7482 |
| Popis: |
This paper applies the stochastic finite element method (SFEM) to perform the natural frequency analysis of functionally graded material (FGM). It is assumed that the elastic modulus and width of the FGM beam vary along the thickness and width directions following exponential functions. The stochastic eigenvalue problem is solved independently by first-order perturbation and Monte Carlo simulation (MCS) method through changing elastic modulus as spatial randomness. The results show that the first-order perturbation method based SFEM produces a very close value to MCS method. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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