| Popis: |
This paper presents circuit monitoring, reviewing different classes of silicon monitoring solutions, the specificity of each class, and where they best fit in the life-cycle of circuit design. A diversified circuit monitoring strategy is presented, that encompasses Early-Silicon versus Computer-Aided-Design (CAD) calibration, In-Die High Volume Manufacturing (HVM) testing and In-Field Dynamic monitoring, coupled with Adaptative Voltage Scaling (AVS) and/or Adaptative Body-Bias (ABB) live compensation. Illustrations of Silicon measurement and CAD simulation analysis from 40nm CMOS and 28nm FD-SOI, general purpose and automotive derivative, are presented. |
