Contact resonance AFM to quantify the in-plane and out-of-plane loss tangents of polymers simultaneously
| Autor: | Joseph A. Turner, Ehsan Rezaei |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Physics and Astronomy (miscellaneous)
02 engineering and technology 01 natural sciences Viscoelasticity symbols.namesake chemistry.chemical_compound Optics Indentation 0103 physical sciences Composite material 010302 applied physics Physics chemistry.chemical_classification business.industry Resonance Polymer 021001 nanoscience & nanotechnology Condensed Matter::Soft Condensed Matter chemistry symbols Dielectric loss Polystyrene 0210 nano-technology business Lorentz force Excitation |
| Zdroj: | Applied Physics Letters. 110:101902 |
| ISSN: | 1077-3118 0003-6951 |
| Popis: | Contact resonance atomic force microscope (AFM) methods are used to quantify the elastic and viscoelastic properties of numerous materials including polymers. More recently, U-shaped AFM thermalevers have been developed to allow the local heating of samples, and the resonances of these probes are much more complex. These probes also allow the in-plane and out-of-plane tip-sample motion to be excited independently at the same location using a Lorentz force excitation. Here, such a probe is used to determine the in-plane and out-of-plane viscoelastic properties at the same location. The approach is demonstrated with respect to the indentation and shear loss tangents on high-density polyethylene and polystyrene. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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