Dirac II series in 800T fields: Reflectivity measurements on low-dimensional, low electron density materials

Autor:	W. S. Lewis, B.R. Marshall, Andrew S. Dzurak, Bruce E. Kane, D. Devore, S. Gallegos, M. J. Hafich, R. G. Clark, J.C. King, Charles H. Mielke, N. Miura, M. Fowler, D. J. Clark, M. Grover, V.V. Platonov, J. Detwiler, G. Leach, James S. Brooks, L. W. Engel, Dwight G. Rickel, A.I. Bykov, L. Tabaka, E. C. Clark, J.A. Cothern, Jerry A. Simmons, Olga M. Tatsenko
Rok vydání:	1998
Předmět:	Physics Electron density Series (mathematics) Condensed matter physics business.industry Dirac (software) Condensed Matter Physics Reflectivity Electronic Optical and Magnetic Materials Magnetic field Wavelength Semiconductor Electrical and Electronic Engineering business Electrical conductor
Zdroj:	Physica B: Condensed Matter. :50-53
ISSN:	0921-4526
Popis:	We report reflectivity measurements at 810 nm wavelength on GaAs/GaAlAs multiple quantum wells and NbSe2 layers at 75 K up to magnetic fields of 800 T. In the GaAs system, we observed in two separate measurements new, reproducible oscillatory phenomena in the reflectivity between 30 and 800 T, and in a third measurement on 2H-NbSe2 we observed a decrease in reflectivity of about 50% above 200 T, with some additional evidence for oscillatory behavior. We discuss these measurements based on the expected behavior in terms of their known physical properties, and consider future prospects for the application of optical methods to study condensed matter physics under these extremes.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cba853028aa86cb9e4a45206dd7321b4 https://doi.org/10.1016/s0921-4526(98)00024-6 Zobrazit plný text záznamu Full Text from ScienceDirect