Improved technique for measuring refractive index and thickness of a transparent plate
| Autor: | Zhi-Cheng Jian, Cheng-Chih Hsu, Der-Chin Su |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Heterodyne
Phase difference Materials science business.industry Fresnel rhomb Physics::Optics Michelson interferometer Wavelength shift Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Optics law Optoelectronics Light beam Heterodyne interferometry Electrical and Electronic Engineering Physical and Theoretical Chemistry business Refractive index |
| Zdroj: | Optics Communications. 226:135-140 |
| ISSN: | 0030-4018 |
| Popis: | The phase difference between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from a transparent plate is measured. The measured data is substituted into the specially derived equations and the refractive index can be calculated. Next, the variations of phase difference between s- and p-polarizations due to the wavelength shift and the extraction of the plate in a modified Michelson interferometer are measured. Then, its thickness can be calculated based on the measured value of refractive index, the variations of phase difference, and the specified value of wavelength shift. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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