| Autor: |
Guy Feuillet, Pierre-Henri Jouneau, I. C. Robin, Matthieu Lafossas, F. Levy, Milan Rosina, Pierre Ferret |
| Rok vydání: |
2009 |
| Předmět: |
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| Zdroj: |
Microelectronics Journal. 40:242-245 |
| ISSN: |
0026-2692 |
| DOI: |
10.1016/j.mejo.2008.07.019 |
| Popis: |
We report on ZnO nanorods grown by catalyst-free metal-organic chemical vapour deposition (MOCVD) in a commercial Epigress reactor using diethylzinc and N"2O as precursors. Well-aligned ZnO nanorods with uniform diameter, length and density have been grown perpendicularly to the sapphire (0001) surface. Scanning electron microscopy (SEM) has been used to observe the morphology of the ZnO nanorods and X-ray diffraction and transmission electron microscopy (TEM) to investigate the crystalline structure of the nanorods. TEM observation as well as photoluminescence measurements confirm the very good crystalline quality of the nanorods. SEM observation on samples that have been prepared with various deposition times has been used in order to investigate the growth mechanism. Three types of ZnO morphologies have been identified: a thin two-dimensional ZnO layer formed at the sapphire surface, covered by three-dimensional hexagonal-shaped islands and hexagonal nanorods on top of them. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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Full Text from ScienceDirect