Probing beneath the surface without a scratch — Bulk non-destructive elemental analysis using negative muons
| Autor: | Katsu Ishida, D. McK. Paul, Adrian D. Hillier |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Surface (mathematics)
Materials science Muon business.industry Nanotechnology 02 engineering and technology 021001 nanoscience & nanotechnology 010403 inorganic & nuclear chemistry 01 natural sciences 0104 chemical sciences Analytical Chemistry Optics Scratch Elemental analysis Non destructive Calibration Neutron 0210 nano-technology business computer Spectroscopy computer.programming_language |
| Zdroj: | Microchemical Journal. 125:203-207 |
| ISSN: | 0026-265X |
| DOI: | 10.1016/j.microc.2015.11.031 |
| Popis: | The development of elemental analysis at the ISIS pulsed neutron and muon facility, STFC Rutherford Appleton Laboratory, UK, is described. Presented are recent results from the calibration of the new setup and this shows the technique can be a powerful tool in determining the composition of materials in bulk, not just at the surface. Moreover, this technique is non-destructive and should be sensitive to all elements (perhaps with the exception of H and He). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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