Determination of surface-layer parameters on pure liquids via ellipsometry
| Autor: | S. G. Il’ina, E. A. Alekseeva |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Work (thermodynamics)
Materials science 010308 nuclear & particles physics business.industry General Physics and Astronomy Substrate (electronics) 01 natural sciences Molecular physics Wavelength Optics Ellipsometry Angle of incidence (optics) 0103 physical sciences Surface layer 010306 general physics business Refractive index Layer (electronics) |
| Zdroj: | Moscow University Physics Bulletin. 71:208-214 |
| ISSN: | 1934-8460 0027-1349 |
| DOI: | 10.3103/s0027134916010094 |
| Popis: | In this work we describe a method for evaluating such parameters of an interfacial layer as the refractive index and thickness of the liquid–vapor interface, based on the measured ellipticity coefficient, ρ, at different wavelengths of the probing light and the data [1] for several pure fluids. In particular, the change in the main angle of incidence was evaluated in the “layer on the substrate” structure. The surface layer is assumed to be homogeneous. |
| Databáze: | OpenAIRE |
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