Thick film resistors for AlN ceramics
| Autor: | K. Yamada, Kiyoshi Kanai, Takahashi Shigeru, Tsuneo Endoh, Yasutoshi Kurihara |
|---|---|
| Rok vydání: | 1991 |
| Předmět: |
Materials science
Softening point General Engineering chemistry.chemical_element Nitride Omega Industrial and Manufacturing Engineering Thermal expansion Electronic Optical and Magnetic Materials law.invention Condensed Matter::Materials Science chemistry Aluminium law Condensed Matter::Superconductivity visual_art visual_art.visual_art_medium Ceramic Electrical and Electronic Engineering Resistor Composite material Temperature coefficient |
| Zdroj: | IEEE Transactions on Components, Hybrids, and Manufacturing Technology. 14:199-203 |
| ISSN: | 0148-6411 |
| DOI: | 10.1109/33.76532 |
| Popis: | RuO/sub 2/ thick-film resistors for aluminum nitride (AlN) ceramics with controlled temperature coefficient of the resistor (TCR) and reliabilities have been developed. The resistors, in the range of approximately 10 Omega / Square Operator to 10 k Omega / Square Operator were obtained using a crystallized glass powder and a RuO/sub 2/ powder, binder materials, and a conducting material. The glass had a low PbO content of 6 wt %, a low thermal expansion coefficient of 3.6*10/sup -6// degrees C, and a softening point of 610 degrees C. The resistors, to which MnO/sub 2/ was added to the above combination, had excellent TCRs of +or-250 p.p.m./ degrees C at 30 Omega / Square Operator to 30 k Omega / Square Operator . These resistors showed small resistance changes, which were less than +1.0% after a thermal cycle test (-55-150 degrees C, 1000 times) and high-temperature storage test, ( 150 degrees C, 1000 h). They had excellent resistance stability. Further, the effect of particle size of glass and RuO/sub 2/ powders on electrical properties of the resistors containing the crystallized glass was similar to that in resistors containing noncrystallized glass for alumina ceramics. > |
| Databáze: | OpenAIRE |
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