| Autor: |
G.L. Lan, J.C. Chen, C.K. Pao, M.I. Herman |
| Rok vydání: |
2002 |
| Předmět: |
|
| Zdroj: |
IEEE International Digest on Microwave Symposium. |
| DOI: |
10.1109/mwsym.1990.99756 |
| Popis: |
A novel approach for deembedding is presented which utilizes known physical transmission line lengths instead of electrical characteristics for calibration standards. This allows one to perform millimeter-wave deembedding for waveguide-based vector network analyzers. Theoretical formulation of ETRL and experimental characterization for V-band microstrip lines are shown. Important design guidelines, and selection of valid root choice of the formulation are described. > |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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