Cross-sectional high-resolution transmission electron microscopy of the microstructure of electrochromic nickel oxide
| Autor: | Xingfang Hu, Yongxiang He, Xiaomin Chen, Carl M Lampert, X.Y. Song |
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| Rok vydání: | 2000 |
| Předmět: |
Materials science
Renewable Energy Sustainability and the Environment Nickel oxide Analytical chemistry Grain size Surfaces Coatings and Films Electronic Optical and Magnetic Materials Indium tin oxide Crystallography Electron diffraction Electrochromism Transmission electron microscopy Selected area diffraction High-resolution transmission electron microscopy |
| Zdroj: | Solar Energy Materials and Solar Cells. 63:227-235 |
| ISSN: | 0927-0248 |
| DOI: | 10.1016/s0927-0248(00)00012-x |
| Popis: | Electrochromic nickel oxide films on indium tin oxide (ITO) were investigated by cross-sectional high-resolution transmission electron microscopy and energy dispersive X-ray analysis. Microstructural features and the differences between high and poor-quality samples were studied and compared. The dominant phase of the NiO film has cubic structure, but selected area electron diffraction patterns revealed many extra diffraction spots for the high-performance samples which may result from additional hydrated nickel oxide phases. The NiO grains do not show clear shapes in the cross-sectional plane nor are there signs of a preferred orientation. The mean grain size is larger and there are more defects and superlattices in samples with good electrochromic properties. There was a clear correlation between grain size distribution and performance. The high-quality samples had a mean grain size of about 6.5 nm, whereas the poor-quality samples exhibited significantly smaller mean grain sizes of 5.0 and 3.8 nm. |
| Databáze: | OpenAIRE |
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