| Autor: |
Vitaly I. Salo, Marina I. Kolybayeva, V. F. Tkachenko |
| Rok vydání: |
1999 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.344375 |
| Popis: |
Structural quality of the interface 'seed crystal' of rapid grown KDP crystals was studied by the X-ray diffraction method with high resolution. The presence of a transitional zone seed - crystal more than 12 mm in width, with an increased concentration of defects and nonmonotone variation of the crystal lattice parameter was found. Found and determines was the turn angle between two growth sectors which makes approximately 32 arcs. It was shown that formation of defects at growing the crystal in the directions and produces a significant effect on structural quality of the crystal grown in the direction. The main growth defects of structure were found to be impurity striation a low angle quasi-boundaries caused by the mechanisms of layer-by-layer growth of crystals. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
