Test Methodology for Defect-Based Bridge Faults

Autor:	Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao
Rok vydání:	2022
Předmět:	Hardware and Architecture Electrical and Electronic Engineering Software
Zdroj:	IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30:975-988
ISSN:	1557-9999 1063-8210
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ca07a3fc293166334a3bd6b04c0053b7 https://doi.org/10.1109/tvlsi.2022.3154535 Zobrazit plný text záznamu