Ellipsometric study of the nucleation of (211) HgCdTe on CdZnTe(211)B

Autor:	James W. Garland, S. Sivananthan, J. Zhao, G. Badano, Yong Chang
Rok vydání:	2003
Předmět:	In situ Void (astronomy) Reflection high-energy electron diffraction business.industry Chemistry Analytical chemistry Nucleation Heterojunction Condensed Matter Physics Inorganic Chemistry Optics X-ray photoelectron spectroscopy Microscopy Materials Chemistry business Molecular beam epitaxy
Zdroj:	Journal of Crystal Growth. 258:374-379
ISSN:	0022-0248
Popis:	We have grown numerous samples under Hg-deficient conditions, in order to study the formation of void defects. The surface morphology of all samples grown was characterized using optical and SEM microscopy. At the same time, the substrates were studied prior to nucleation using in situ spectroscopic ellipsometry (SE). We find a correlation between the ellipsometric signal prior to nucleation and the final morphology of the layers grown. We studied the Hg layer present at the surface before nucleation by RHEED, XPS and SE. A better model is proposed, which reflects the physical characteristics of the substrate surface.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c9bc3ccaa1b068946f3bd60dbee5a0be https://doi.org/10.1016/s0022-0248(03)01559-8 Zobrazit plný text záznamu Full Text from ScienceDirect