CHARACTERIZATION OF BIDIRECTIONAL TRANSMISSIVE AND REFLECTIVE PROPERTIES OF BLACK SILICON
| Autor: | Georgi T. Georgiev, James J. Butler, Ron Shiri, Christine A. Jhabvala |
|---|---|
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Journal of Physics: Conference Series. 2149:012012 |
| ISSN: | 1742-6596 1742-6588 |
| Popis: | This paper describes the initial work of characterizing the transmissive and reflective properties of black silicon diffusers. The diffusers were fabricated from a 100 mm diameter black silicon sample at NASA’s Goddard Space Flight Center (GSFC). The directional hemispherical reflectance from 250 nm to 2500 nm and BRDF/BTDF measurements at 632.8 nm, 1064 nm, and 1550 nm were measured using the GSFC Diffuser Calibration Laboratory’s (DCL) spectrophotometer and optical scatterometer. The diffusers exhibit a low level of specular reflection up to ~1100 nm with no evidence of retroscatter. The measurements are traceable to those made at the National Institute of Standards and Technology (NIST). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|