High resolution X-ray diffraction imaging of lead tin telluride

Autor:	David R. Black, Bruce Steiner, Harold E. Burdette, Masao Kuriyama, Richard D. Spal, Archibald L. Fripp, Richard T. Simchick, Ronald C. Dobbyn
Rok vydání:	1991
Předmět:	Diffraction business.industry Crystal growth Crystal structure Condensed Matter Physics Microstructure Inorganic Chemistry Tin telluride chemistry.chemical_compound Lead Metal Optics chemistry X-ray crystallography Materials Chemistry Substructure business
Zdroj:	Journal of Crystal Growth. 114:707-714
ISSN:	0022-0248
Popis:	High resolution X-ray diffraction images of two directly comparable crystals of lead tin telluride, one Bridgman-grown on Space Shuttle STS 61A and the other terrestrially Bridgman-grown under similar conditions from identical material, present different subgrain structure. In the terrestrial, sample 1 the appearance of an elaborate array of subgrains is closely associated with the intrusion of regions that are out of diffraction in all of the various images. The formation of this elaborate subgrain structure is inhibited by growth in microgravity.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c8dc5af5b0765a92b0afa77281a9d5ce https://doi.org/10.1016/0022-0248(91)90420-a Zobrazit plný text záznamu