| Autor: |
Soufiene Krimi, Frank Ellrich, Rene Beigang, Jens Klier, Joachim Jonuscheit, Ralph Urbansky, G. von Freymann |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz). |
| Popis: |
We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of model-based material parameters extraction, a generalized transfer matrix method, and an evolutionary optimization algorithm. The proposed approach has been successfully applied to resolve individual layer thicknesses down to 5 μm in multilayered automotive paint samples. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
