Improving reliability for bit parallel finite field multipliers using Decimal Hamming

Autor: Nikolaos Mavrogiannakis, Dhiraj K. Pradhan, Costas Argyrides
Rok vydání: 2010
Předmět:
Zdroj: EWDTS
DOI: 10.1109/ewdts.2010.5742055
Popis: Technology evolution dictates ever increasing density of transistors in chips, lower power consumption and higher performance. In such environment occurrence of multiple-bit upsets (MBUs) is a concern. That, together with the presence of fault-related attacks in cryptographic Hardware act as our motivation. The outcome of which, being presented in this paper, is a systematic method for designing multiple error correction multipliers for finite fields or GF(2m). We use a variation of Hamming Codes referring to as Decimal Hamming [14] to achieve this. We have shown that out technique can improve dramatically the reliability of a bigger multiplier by using our technique in conjunction with a series of smaller multipliers.
Databáze: OpenAIRE