Implementation of Short-Term Plasticity and Long-Term Potentiation in a Synapse Using Si-Based Type of Charge-Trap Memory
Autor: | Jong-Ho Lee, Change-Hee Kim, Myoung-Sun Lee, J. W. Lee, Byung-Gook Park |
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Rok vydání: | 2015 |
Předmět: | |
Zdroj: | IEEE Transactions on Electron Devices. 62:569-573 |
ISSN: | 1557-9646 0018-9383 |
DOI: | 10.1109/ted.2014.2378758 |
Popis: | We present a novel silicon-based type of charge-trap memory using Al/HfO2/Al2O3/Si3N4/Si structure mimicking memory functions in a biological synapse. The quantity of the trapped charge in the proposed Al2O3/HfO2/Si3N4 stack is estimated by measuring the capacitance over time, which can be regarded as synaptic weight changes. By applying repeated voltage pulses at periodic intervals of different times, reliable short-term plasticity and long-term potentiation properties are obtained along with their transition behavior. This architecture is compatible with the CMOS process and shows great promise as an essential part for the implementation of an electrical neuromorphic system. |
Databáze: | OpenAIRE |
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