Non-destructive defect level analysis of graphene using amplitude-modulated discharge current analysis
| Autor: | Soyoung Kim, Soo Cheol Kang, Byoung Hun Lee, Sunwoo Heo, Seung-Mo Kim, Yongsu Lee, Tae Jin Yoo, Hyeon Jun Hwang, Ho-In Lee |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Range (particle radiation)
Materials science Fabrication Graphene business.industry Discharge current Charge (physics) 02 engineering and technology General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences law.invention Amplitude law Non destructive Optoelectronics General Materials Science 0210 nano-technology business Energy (signal processing) |
| Zdroj: | Carbon. 179:627-632 |
| ISSN: | 0008-6223 |
| Popis: | The intrinsic characteristics of novel devices and materials are often misunderstood due to the characterization methods which are developed to analyze existing devices or materials. Even though graphene is a very well-known material, there hasn't been a proper method to assess the density and energy levels of defects in graphene non-destructively, especially after the device fabrication. Here, we report a new non-destructive defect analysis method, amplitude-modulated discharge current analysis (AMDCA). The validity of this method was confirmed using a graphene field effect transistor with physically predefined defect densities in the channel. Charge trap densities ( N c t ) of the order of ∼1012 cm−2 were observed at the defect level in the range of 0.15–0.29 eV. This method can be very useful for the in-depth study of graphene devices as well as other two-dimensional materials that don't have a body contact. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect