Optical Test System for Reflective Electro-Optical Adaptive Micro-Device Phase Measurement

Autor: Dale E. Ewbank
Rok vydání: 2006
Předmět:
Zdroj: Frontiers in Optics.
Popis: A system to measure phase for reflective electro-optical micro-devices at visible wavelengths was developed. Relative phase versus voltage is required for control design of devices utilizing electro-optic materials such as polymer dispersed liquid crystals.
Databáze: OpenAIRE