Comprehensive Study of Long-Term Reliability of Copper Bonding Wires at Harsh Automotive Conditions

Autor:	Robert Klengel, Sandy Klengel, Sebastian Tismer, Thomas Ackermann, Noritoshi Araki, Motoki Eto, Teruo Haibara, Takashi Yamada, Jochen Feldmann, Ralph Binner, Henk Peters, Achim Scheer, Vincent Chee
Rok vydání:	2022
Zdroj:	2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c81eb9395612d9f2b5f452090ea5b8d2 https://doi.org/10.1109/ectc51906.2022.00083 Zobrazit plný text záznamu