Structural Properties of the Low-Temperature Phase of the Hexadecane/Urea Inclusion Compound, Investigated by Synchrotron X-ray Powder Diffraction
| Autor: | Heliodoro Serrano-González, Kenneth D. M. Harris, Lily Yeo, Benson M. Kariuki |
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| Rok vydání: | 1997 |
| Předmět: |
Diffraction
Materials science Rietveld refinement Hexadecane Synchrotron Surfaces Coatings and Films law.invention Inclusion compound chemistry.chemical_compound Crystallography chemistry law Condensed Matter::Superconductivity Phase (matter) Materials Chemistry Molecule Physical and Theoretical Chemistry Powder diffraction |
| Zdroj: | The Journal of Physical Chemistry B. 101:9926-9931 |
| ISSN: | 1520-5207 1520-6106 |
| DOI: | 10.1021/jp971607d |
| Popis: | The structural properties of the hexadecane/urea inclusion compound have been determined, using Rietveld refinement, from synchrotron X-ray powder diffraction data recorded at temperatures above and below the phase transition temperature (ca. 150 K) for this inclusion compound. Structural characterization of the low-temperature phase by single-crystal diffraction techniques is limited by the fact that single crystals of the inclusion compound become multiply twinned on cooling below the phase transition temperature. The structural properties determined for the high-temperature phase at ambient temperature are in agreement with those reported previously from single-crystal X-ray diffraction data; the urea molecules form a hexagonal host tunnel structure, with an incommensurate relationship between the periodicities of the host and guest substructures along the tunnel axis. The host structures in the low-temperature and high-temperature phases are sufficiently similar that the high-temperature host structur... |
| Databáze: | OpenAIRE |
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