Near-infrared photodetector achieved by chemically-exfoliated multilayered MoS2 flakes
| Autor: | Hyungduk Ko, Kisun Park, Min Ji Park |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Materials science
business.industry Band gap Near-infrared spectroscopy General Physics and Astronomy Photodetector 02 engineering and technology Surfaces and Interfaces General Chemistry 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Exfoliation joint 0104 chemical sciences Surfaces Coatings and Films Responsivity Nanocrystal Optoelectronics 0210 nano-technology business Absorption (electromagnetic radiation) Plasmon |
| Zdroj: | Applied Surface Science. 448:64-70 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2018.04.085 |
| Popis: | A near-infrared (NIR) photodetector built from chemically exfoliated multilayer MoS2 films was investigated. Devices that are photoresponsive to wavelengths up to 1550 nm were fabricated using 25-nm-thick MoS2 films. To the best of our knowledge, this is the first time such a detector was produced using chemical exfoliation. As the thickness was increased to 25 nm, the MoS2 flakes formed a nearly or fully continuous film with a 2H-dominant phase, and also exhibited enhanced NIR absorption up to 1550 nm. We conjecture that the defects formed during chemical exfoliation affect the intrinsic bandgap of MoS2, extending its spectral absorption range into the NIR range. Moreover, the responsivity of the device was enhanced by introducing plasmonic Ag nanocrystals. |
| Databáze: | OpenAIRE |
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