Atomic Force Microscopy Investigation of Polystyrene and Polystyrene/PMMA Composites Surfaces

Autor: Ryszard Czajka, Halina Kaczmarek, Marek Nowicki, B. Susła
Rok vydání: 2000
Předmět:
Zdroj: Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals. 354:167-172
ISSN: 1058-725X
DOI: 10.1080/10587250008023611
Popis: The surface morphology of polystyrene (PS) before and after u.v.-irradiation was studied by means of Atomic Force Microscopy (AFM). The u.v.-irradiation of PS sample doped with poly(methyl methacrylate) caused distinct changes in surface morphology. The nanometer-scale structures of the rod-like shape bumps of diameter of 300 nm and the height of 75 nm were created. We also showed that the very small forces of 0.2 nN are enough high to modify the surface of PS samples.
Databáze: OpenAIRE