Single-Electron Fault Tolerance in Quantum Cellular Automata Majority Gate

Autor:	Ehsan Rahimi, Hamid Sheibani
Rok vydání:	2021
Předmět:	Scale (ratio) Computer science Fault tolerance Hardware_PERFORMANCEANDRELIABILITY General Medicine Topology Electric charge Single electron Hardware and Architecture Electrical and Electronic Engineering Nanoscopic scale AND gate Hardware_LOGICDESIGN Quantum cellular automaton
Zdroj:	Journal of Circuits, Systems and Computers. 30:2150168
ISSN:	1793-6454 0218-1266
DOI:	10.1142/s0218126621501681
Popis:	Quantum cellular automata (QCA) is a promising paradigm that enables performing arithmetic and logic operations at the nanoscopic scale. The QCA utilizes the configuration of electric charges in molecular scale quantum-dots to encode binary information. Defects are very likely to occur at the nanoscale and impact the operation of QCA devices. We concentrate on a specific fault, which is caused by impurities in materials used in packaging devices. These defects may cause a single-electron to tunnel outside a QCA cell and lead to a single-electron fault (SEF). Cosmic rays may also lead to a SEF. The three-input majority gate is the primary device in the QCA paradigm. In this paper, the effect of redundant cells on the fault tolerance of the majority gate is studied in the presence of a SEF. We present figures based on the number of redundant cells, their positions, and the clock method, which are essential in designing SEF-tolerant devices.
Databáze:	OpenAIRE
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