Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power Devices
| Autor: | R. Gaillard, Sebastien Morand, Florent Miller, T. Carriere, N. Buard, A Douin |
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| Rok vydání: | 2011 |
| Předmět: |
Nuclear and High Energy Physics
Computer science business.industry Test method Insulated-gate bipolar transistor Laser law.invention Nuclear Energy and Engineering law Nondestructive testing Electronic engineering Power semiconductor device Transient (oscillation) Sensitivity (control systems) Electrical and Electronic Engineering Power MOSFET business |
| Zdroj: | IEEE Transactions on Nuclear Science. 58:813-819 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | This paper presents a new test methodology based on the characterization of transient events to perform non-destructive radiation sensitivity assessments of destructive single event effects in power devices. Laser tests and simulations are used to demonstrate its efficiency. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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