Spectroscopy of surface space charge layers

Autor:	J. Frederick Koch
Rok vydání:	1976
Předmět:	business.industry Chemistry Cyclotron resonance Surfaces and Interfaces Conductivity Condensed Matter Physics Space charge Surfaces Coatings and Films Semiconductor Depletion region Materials Chemistry Surface layer Atomic physics business Spectroscopy Double layer (surface science)
Zdroj:	Surface Science. 58:104-127
ISSN:	0039-6028
DOI:	10.1016/0039-6028(76)90120-5
Popis:	Spectroscopic studies of the semiconductor surface space charge layer system complement and enlarge on the information derived from dc transport experiments. The paper fkst gives an account of far-infrared cyclotron resonance and dynamical conductivity studies in the surface layer. Such work explores the carrier motion in the plane of the space charge layer. A later section discusses intersubband spectroscopy, experiments in which the quantized motion in bound levels normal to the surface is probed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c69145df4aeea10c199e0b3c9c30c9ef https://doi.org/10.1016/0039-6028(76)90120-5 Zobrazit plný text záznamu