Low power and high fault coverage SIC reseeding TPG using x-filling techniques for Scan BIST

Autor:	Sabir Hussain
Rok vydání:	2017
Předmět:	Environmental Engineering Hardware and Architecture Computer science General Chemical Engineering Fault coverage General Engineering Computer Science (miscellaneous) Electronic engineering Biotechnology Power (physics)
Zdroj:	International Journal of Engineering & Technology. 7:220
ISSN:	2227-524X
DOI:	10.14419/ijet.v7i1.2.9232
Popis:	This paper has been withdrawn.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c6297076856cfb4050d3393d9c472673 https://doi.org/10.14419/ijet.v7i1.2.9232 Zobrazit plný text záznamu