High-Temperature Dependent Data Extraction and Modeling of Effective Channel Mobility in MOSFETs using Measured S-Parameters
Autor: | Dae-Hyoun Jung, B. Ko, Sang-gi Lee |
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Rok vydání: | 2009 |
Předmět: | |
Zdroj: | Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials. |
DOI: | 10.7567/ssdm.2009.p-3-16 |
Databáze: | OpenAIRE |
Externí odkaz: |