| Autor: |
A. Benhassain, Florian Cacho, Chittoor Parthasarathy, Abhishek Jain, V. Knopik, S. Mhira, P. Cathelin, Lorena Anghel, Ajith Sivadasan, Vincent Huard |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
IOLTS |
| Popis: |
Reliability for advanced CMOS nodes is becoming very challenging. The trade-off between high performance and reliability requirement can no longer be addressed by rough extra-margin. It would results in an overdesign and strong penalty of performance and area. A fine-grain analysis of mission profile is the path toward accurate assessment of ageing. A wide review of methodologies and results are presented, they are applied to digital, analog and RF/mmW circuits. Important set of experimental results are shown and compared to simulation. This paper highlights the correlation between activity profiling or workload and degradation performance induced by ageing. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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