Investigation of the possibility of using x-ray sensitive lines detection technology in microfocus radiography

Autor:	V. V. Klonov, I. A. Larionov, A. S. Kiselev, N. E. Staroverov, I. V. Alexandrov
Rok vydání:	2020
Předmět:	Materials science Optics business.industry Radiography X-ray business
Zdroj:	6TH INTERNATIONAL CONFERENCE ON X-RAY, ELECTROVACUUM AND BIOMEDICAL TECHNIQUE.
ISSN:	0094-243X
DOI:	10.1063/5.0014076
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c59ff45fbd0bd691782e8ce987183fc4 https://doi.org/10.1063/5.0014076 Zobrazit plný text záznamu