Effects Degrading Accuracy of CPW mTRL Calibration at W Band
| Autor: | Thorsten Probst, Wolfgang Heinrich, G. N. Phung, Uwe Arz, F.J. Schmuckle, Ralf Doerner |
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| Rok vydání: | 2018 |
| Předmět: |
Accuracy and precision
Materials science Acoustics Coplanar waveguide 020208 electrical & electronic engineering Process (computing) 020206 networking & telecommunications 02 engineering and technology W band Line (geometry) 0202 electrical engineering electronic engineering information engineering Calibration Device under test Well-defined |
| Zdroj: | 2018 IEEE/MTT-S International Microwave Symposium - IMS. |
| Popis: | On-wafer measurements of a Device Under Test (DUT) can yield accurate results only if the properties of the measurement environment are well defined and unwanted effects can be removed from the data. This is commonly achieved through a calibration process using a set of different calibration elements. However, various effects may degrade accuracy of this calibration, particularly at higher frequencies. This paper deals with the case of coplanar waveguide (CPW) lines and the multiline Thru Reflect Line (mTRL) method and discusses two of such issues, the influence of CPW ground width and of prober geometry. |
| Databáze: | OpenAIRE |
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