X-ray characterization of CdTe crystals with natural faces

Autor:	J. Majewski, Z. Furmanik, Z. Golacki, J. Auleytner
Rok vydání:	1990
Předmět:	chemistry.chemical_classification Chemistry X-ray Crystal growth General Chemistry Condensed Matter Physics Cadmium telluride photovoltaics Characterization (materials science) Crystal Crystallography X-ray crystallography Surface structure General Materials Science Inorganic compound
Zdroj:	Crystal Research and Technology. 25:971-976
ISSN:	1521-4079 0232-1300
DOI:	10.1002/crat.2170250822
Popis:	The exact characterization of natural crystal faces is very important from the point of view of the proper conditions of crystal growth and of the choice of an appropriate substrate for obtaining epitaxial layers. In this work various X-ray diffraction methods were used to obtain the maximum information about the CdTe crystal surface structure. Applied X-ray techniques allowed to detect the number of defects even on the natural mirror-like faces of the crystal which can be treated as a seemingly perfect one. Genaue Charakterisierung des Perfektion-Zustandes der Grenzflachen eines Kristalls ist sehr wichtig von dem Standpunkt der Untersuchungen der Kristallwachstumsbedingungen und der Wahl eines guten Substrates fur epitaktischen Kristallwachstum. In dieser Arbeit wurden verschiedene Rontgenbeugungs-methoden angewandt, um moglich viele Informationen uber CdTe-Kristall-Grenzflachen-Struktur zu erhalten. Diese Methoden erlauben sogar im Falle auserlich guter Kristalle viele Defekten zu enthullen.
Databáze:	OpenAIRE
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