A SURVEY ON ADVANCED ATTENDANCE API

Autor: J Jeevandeep, Chintan G, Deekshith G M, Anirudh C R, Sandeep R
Rok vydání: 2022
Zdroj: International Research Journal of Computer Science. 9:1-4
ISSN: 2393-9842
DOI: 10.26562/irjcs.2022.v0902.001
Popis: In today's rapidly changing world, automatic face recognition (AFR) technologies have made significant advances. Keeping up with the attendance register day by day is a troublesome and tedious process. There are many robotized strategies for a similar application like biometrics, radio-frequency identification (RFID), iris detection, voice detection, and more. The objective of this paper is to review some of the state-of-the-art techniques used in the implementation of marking attendance. The existing methodologies show that there is a scope for improvement in the implementation of smart attendance. In our future work, we want to present a framework by utilizing deep learning and thereby tap into the potential that it guarantees in the field of face-based biometrics.
Databáze: OpenAIRE