| Autor: |
Jin Sam Kim, In Su Park, Jae Young Kim, Woo Jin Lee, Young Sul Shin, Sung Ho Ahn |
| Rok vydání: |
2010 |
| Předmět: |
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| Zdroj: |
The KIPS Transactions:PartD. :147-156 |
| ISSN: |
1598-2866 |
| DOI: |
10.3745/kipstd.2010.17d.2.147 |
| Popis: |
Conformance testing for embedded software is to check whether software was correctly implemented according to software specification or not. In conformance testing, test scenarios must be extracted to cover every test cases of software. In a general way, test scenarios simply focus on testing all functions at least one time. But, test scenarios are necessary to consider efficiency of test execution. In this paper, we propose a test scenario extraction method by considering function`s execution time and waiting time for user interaction. A test model is a graph model which is generated from state machine diagram and test cases in software specification. The test model is augmented by describing test execution time and user interaction information. Based on the test model, test scenarios are extracted by a modified Dijkstra`s algorithm. Our test scenario approach can reduce testing time and improve test automation. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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