An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications

Autor:	M. Carissimi, C. Auricchio, E. Calvetti, L. Capecchi, M. Torres, S. Zanchi, P. Gupta, R. Zurla, A. Cabrini, D. Gallinari, F. Disegni, M. Borghi, E. Palumbo, A. Redaelli, M. Pasotti
Rok vydání:	2022
Zdroj:	ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC).
DOI:	10.1109/esscirc55480.2022.9911379
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c44afff39b8bb33c70b586835adae0af https://doi.org/10.1109/esscirc55480.2022.9911379 Zobrazit plný text záznamu