| Autor: |
L.S. Vaidhyanathan, C. S. Sundar, R. Nagendran, N. Chinnasamy, M. P. Janawadkar, R. Baskaran, N. Thirumurugan |
| Rok vydání: |
2010 |
| Předmět: |
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| Zdroj: |
NDT & E International. 43:713-717 |
| ISSN: |
0963-8695 |
| DOI: |
10.1016/j.ndteint.2010.08.003 |
| Popis: |
Detailed experimental studies have been carried out for the determination of optimum eddy current excitation frequencies for the defects located at different depths below the top surface of an aluminum plate. These subsurface defects were detected by using a highly sensitive superconducting quantum interference device (SQUID) based eddy current non-destructive evaluation (NDE) system. The signal to noise ratio was found to be significantly higher at the optimum excitation frequency, which depended on the depth of the defect. The optimum excitation frequencies have been evaluated for defects located at different depths from 2 to 14 mm below the top surface of the plate. The defect depth was varied in steps of 2 mm, while the overall total thickness of the stack of plates was kept constant at 15 mm. Each defect represented a localized loss of conductor volume, which was 60 mm in length, 0.75 mm in width and 1 mm in height. The experimental results show that the square root of the optimum excitation frequency is inversely proportional to the depth of defect. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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