| Autor: |
J.H. Burkhart, R.T. McGrath, David S. Walsh, H. Schöne, Barney Lee Doyle |
| Rok vydání: |
1997 |
| Předmět: |
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| Zdroj: |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 130:543-550 |
| ISSN: |
0168-583X |
| Popis: |
The authors have demonstrated the utility of microbeam - Rutherford Back Scattering ({mu} RBS) in spatially resolved studies of operational plasma effects on the interior surfaces of plasma flat panel displays manufactured by Photonics Imaging. The experiments were performed at the Sandia Nuclear microprobe using a 2.8 MeV He beam with an average beam spot size of less than 8{mu}m. The interior surface of the top panes of the flat panels is composed of approximately 800 nm of MgO on top of a 2000nm thick PbO layer. {mu}-RBS of sample panels operated under varying conditions measured changes in the surface MgO film thickness due to plasma erosion and redeposition as accurately as {+-}1.5 nm. The high accuracy in the MgO thickness measurement was achieved by inferring the MgO thickness from the shift of the Pb front edge in the RBS spectrum. An estimate for the thickness accuracy as a function of the acquired statistics is presented. The surface of the flat panels` bottom panes is also comprised of MgO on top of PbO. However, troughs {approximately}100 {mu}m wide by 10{mu}m deep were partially filled with phosphor and cover the entire width of the surface. This leaves only 100pm long sections of MgO within the trough exposed. Using {mu}-RBS, the authors were able to analyze the surface composition of these regions. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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