Nanometer scale conductance change in a Langmuir‐Blodgett film with the atomic force microscope

Autor:	Shunichi Shido, Hiroshi Matsuda, Kiyoshi Takimoto, Ken Eguchi, Koji Yano, Masafumi Kyogaku, Yasuhiro Shimada, Ryo Kuroda, Otto Albrecht, Takashi Nakagiri
Rok vydání:	1996
Předmět:	Nanostructure Materials science Physics and Astronomy (miscellaneous) business.industry Analytical chemistry Conductance Conductive atomic force microscopy Langmuir–Blodgett film law.invention law Optoelectronics Surface modification Nanometre Scanning tunneling microscope business Deposition (law)
Zdroj:	Applied Physics Letters. 68:188-190
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.116455
Popis:	A nanometer scale metal/Langmuir‐Blodgett (LB) film/metal structure is realized with an atomic force microscope combined with scanning tunneling microscope (AFM/STM). Even in this nanometer scale configuration, increase in conductance can be induced at any point in the LB film by application of a voltage pulse. The AFM/STM observation shows little surface modification has occurred by the voltage application, which shows that the conductance of the LB film changes without pit formation in the LB film or metal cluster deposition from the tip of the probe.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c41b128df49bd978ca8193183a50bcef https://doi.org/10.1063/1.116455 Zobrazit plný text záznamu