Secondary ionization mass spectrometric analysis of impurity element isotope ratios in nuclear reactor materials
| Autor: | Tere A. Simmons, David C. Gerlach, David E. Hurley, Winston W. Little, Bruce D. Reid, Anthony J. Wickham, George H. Meriwether, John B. Cliff |
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| Rok vydání: | 2006 |
| Předmět: |
Static secondary-ion mass spectrometry
Isotope Chemistry Radiochemistry Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Nuclear reactor Thermal ionization mass spectrometry Condensed Matter Physics Mass spectrometry Surfaces Coatings and Films law.invention Secondary ion mass spectrometry Neutron flux law Physics::Atomic Physics Physics::Chemical Physics Nuclear Experiment Burnup |
| Zdroj: | Applied Surface Science. 252:7041-7044 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2006.02.221 |
| Popis: | During reactor operations and fuel burn up, some isotopic abundances change due to nuclear reactions and provide sensitive indicators of neutron fluence and fuel burnup. Secondary ion mass spectrometry (SIMS) analysis has been used to measure isotope ratios of selected impurity elements in irradiated nuclear reactor graphite. Direct SIMS measurements were made in graphite samples, following shaping and surface cleaning. Models predicting local fuel burnup based on isotopic measurements of B and Li isotopes by SIMS agreed well with U and Pu isotopic measurements obtained by thermal ionization mass spectrometry (TIMS). |
| Databáze: | OpenAIRE |
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