Coherent X-ray diffraction for domain observation II
| Autor: | Naohiko Yasuda, Jun'ichiro Mizuki, Tomoko Nagata, Kenji Ohwada, Hidehiro Ohwa, D. Shimizu, Kosuke Fujiwara, Naoshi Ikeda, Kazumichi Namikawa |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Crystal Materials science 0103 physical sciences X-ray crystallography 010306 general physics Condensed Matter Physics 01 natural sciences Molecular physics Electronic Optical and Magnetic Materials Characterization (materials science) Domain (software engineering) Coherence length |
| Zdroj: | Ferroelectrics. 513:16-21 |
| ISSN: | 1563-5112 0015-0193 |
| DOI: | 10.1080/00150193.2017.1350058 |
| Popis: | The CXD method have been shown to be applicable to the crystal characterization as well as the domain observation. The present CXD technique could evaluate the crystal coherence length up to 10 μm ... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|